Surface Analytics

Reflected light and transmitted light microscope with database system (Zeiss, AxioImager m2m)

Practical Relevance

  • Surface analytics of sites of fracture
  • Cross-section polish analytics (join connection, pinholes, delaminations and fibre content)
  • measuring of material properties

Florian Holze
Phone +49 5361 8 90 24 5-24
Open Hybrid LabFactory e.V


  • Microscopically system for material characterization of metals, polymers, fibers and hybrid composite materials
  • All relevant lighting processes included polarized transmitted light
  • Fully automated for reproducible microscopy (call up of properties of already saved images)
  • Automatically X-Y-Z stitching possible
  • Database system with server client architecture and license management for use of „Floating Licenses“ for image retrieval and evaluation from each workplace
  • Image import in database of unknown recording sources possible, for example the integration of REM and Keyence microscope

Technical Data

  • Reflected light in bright field and dark field for all optional magnifications possible
  • Polarization in the reflected light and transmitted light
  • Red filter (Lambda/4) for additional contrasting in transmitted light
  • Adjustable DIC
  • Lenses: 2,4x/5x/10x/20x/50x/100x
  • Additional objective 40x with adjustable cover slip correction for transmitted light
  • Motor driven with travelling distance: 130 x 85 mm²
  • Camera resolution 5Mpx

Technical Equipment